Commit Graph

2 Commits

Author SHA1 Message Date
Simran Basi c8f21f6c4e device-tests & general-tests: build out zips.
Generates the output zips of the device-tests & general-tests
buildable suites.

Bug: 35386840
Test: make dist device-tests general-tests -j
Change-Id: I253bcd8615379334b52b4d770a5c4f7e07a58795
2017-03-15 17:56:50 -07:00
Simran Basi 9c295b4415 Add device-tests and general-tests make targets.
Adds the device-tests and general-tests makefiles and
added include lines to main.mk so that individual test
modules can be built properly.

These targets do not build any special tradefed wrapper
that normal *TS's usually employ. They are not necessary
here.

Bug: 35350788
Test: Updated several CTS test modules to belong to these
      suites instead and ran:
      `rm -rf out; make clean; make device-tests general-tests -j`
      then verified the output.

Change-Id: I40e3958375f7b39cb56508f2812ce9760d403f6f
2017-02-21 17:04:47 -08:00